Brevete
Brevete 21
Mentionam brevetele semnificative obtinute si recunoscute la nivel european si mondial.
1. Eucentric type oblique view cone beam tomography and measurement method of 3D objects (autori: M. Misawa (25%), I. Tiseanu (25%), R. Hirashima (17%), N. Wakabayashi (17%), K.Koizumi (16%), No.2002-135870 (Japan), 2002/05/10)
2. Image reconstruction method by the oblique view cone beam tomography (autori: I. Tiseanu (25%), R. Hirashima (17%), N. Wakabayashi (17%), K. Koizumi (16%), 2002-061071(Japan), 2003/03/06)
3. Metoda pentru decontaminare utilizand atomii de azot US Patent Application No: 10/610158, 30. 06. 2003, (2004/0265166A1) (autori: M.Ganciu, A.M.Pointu, B.Legendre, J.Orphal, M.Vervloet, M.Touzeau, N.Yagoubi)
4. X-Ray radiation method for dynamic measure-ment by the fast X-ray Computer Tomography No.2000-147581, 2000/05/19 (Japan) (autori: M. Misawa (50%), I. Tiseanu (50%))
5. A new type of plasma source obtained by using magnetron discharges in high power pulsed regimes, European Patent Appl., No. 4447072.2 / 2004 (autori: M.Ganciu, M.Hecq, S.Konstantinidis J.P.Dauchot, M.Touzeau, L.dePoucques, J.Bretagne)
Inventiile 2 si 3 sunt implementate in urmatoarele instalatii:
Microtomograful de raze X pentru caracteri-zarea probelor de materiale de fuziune din INFLPR, Bucuresti
Sistemele tomografice fabricate de firma germana Hans Waelischmiller GmbH, Markdorf, Germany, (www.hwm.com) principali clienti: Audi, Zeiss, Bosch etc.
Instalatia XVA-160 CT&SLICER (NOIX) de firma japoneza UNI-HITE SYSTEM CORPORATION, Kanagawa 242-0001, Japan, (http://www.uni-hite.co.jp/English/ uhs_index.htm) |
